Depth Profiling Charge Accumulation from a Ferroelectric into a Doped Mott Insulator
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Nano Letters
سال: 2015
ISSN: 1530-6984,1530-6992
DOI: 10.1021/acs.nanolett.5b00104